The progression to ever smaller sizes on substrates and mask/reticles produces lower and lower tolerance to defects while semiconductor manufacturers continue to discover device sensitivities at the deep nano-scale level.
MKS solutions for enhancing semiconductor inspection includes high performance air bearing stages suitable for use in wafer inspection tools and optical sub-system design and manufacturing solutions for wafer inspection tool manufacturers.
MKS Instruments Handbook: Principles & Applications in Photonics Technologies
A free resource from MKS
Semiconductor Inspection
A detailed discussion of the semiconductor inspection process
IR Long Range Zoom Lenses
An extensive collection of long range zoom lenses is designed and built for a wide
range of applications, including semiconductor inspection
Diffraction Grating Handbook
A primary source of information regarding
diffraction gratings used in the inspection process
Air Bearing Stages for Inspection and Metrology
HybrYX stages blend the cost-effectiveness of mechanical bearings with the precision of a single plane air bearing carriage
Air Bearing Stages for Reticle Inspection
DynamYX® RS Reticle Positioning Stage is designed for reticle inspection and repair applications
Spectroscopy Instruments
A complete line of products for spectroscopy applications and the accessories for inspection applications.
Incoherent Light Sources
A wide variety of light sources to meet the needs of semiconductor inspection processes
Optical Receivers
High speed photodetection is critical to extracting and preserving wafer inspection results
Laser Beam Characterization
laser beam analysis products for profiling laser beams, characterizing their pulses, and detecting their position
Optical Tables & Isolation Systems
Newport has become the industry standard for optical tables, isolation systems, and vibration control products
Motion Control
An extensive catalog of manual positioning and motion control standard and custom products enhancing inspection processes.
Optical Filters
A full spectrum of solutions for managing light sources used in wafer inspection